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Hard x-ray photoemission and density functional theory study of the internal electric field in SrTiO3/LaAlO3 oxide heterostructures

机译:SrTiO3 / LaAlO3氧化物异质结构内部电场的硬X射线光发射和密度泛函理论研究

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摘要

A combined experimental and theoretical investigation of the electronic structure of the archetypal oxide heterointerface system LaAlO3 on SrTiO3 is presented. High-resolution, hard x-ray photoemission is used to uncover the occupation of Ti 3d states and the relative energetic alignment—and hence internal electric fields—within the LaAlO3 layer. First, the Ti 2p core-level spectra clearly show occupation of Ti 3d states already for two unit cells of LaAlO3. Second, the LaAlO3 core levels were seen to shift to lower binding energy as the LaAlO3 overlayer thickness, n, was increased, agreeing with the expectations from the canonical electron transfer model for the emergence of conductivity at the interface. However, not only is the energy offset of only ∼300 meV between n=2 (insulating interface) and n=6 (metallic interface) an order of magnitude smaller than the simple expectation, but it is also clearly not the sum of a series of unit-cell-by-unit-cell shifts within the LaAlO3 block. Both of these facts argue against the simple charge-transfer picture involving a cumulative shift of the LaAlO3 valence bands above the SrTiO3 conduction bands, resulting in charge transfer only for n≥4. We discuss effects which could frustrate this elegant and simple charge-transfer model, concluding that although it cannot be ruled out, photodoping by the x-ray beam is unlikely to be the cause of the observed behavior. Turning to the theoretical data, our density functional simulations show that the presence of oxygen vacancies at the LaAlO3 surface at the 25% level reverses the direction of the internal field in the LaAlO3. Therefore, taking the experimental and theoretical results together, a consistent picture emerges for real-life samples in which nature does not wait until n=4 and already for n=2 mechanisms other than internal-electric-field-driven electron transfer from idealized LaAlO3 to near-interfacial states in the SrTiO3 substrate are active in heading off the incipient polarization catastrophe that drives the physics in these systems.
机译:结合实验和理论研究了SrTiO3上原型氧化物异质界面体系LaAlO3的电子结构。高分辨率的硬X射线光发射用于揭示LaAlO3层中Ti 3d态的占据以及相对高能取向以及内部电场。首先,Ti 2p核能级谱清楚地显示了两个LaAlO3晶胞已经占据了Ti 3d态。其次,随着LaAlO3覆盖层厚度n的增加,LaAlO3的核心能级转移到较低的结合能,这与规范电子传输模型对界面电导率的期望相符。但是,不仅n = 2(绝缘界面)和n = 6(金属界面)之间的能量偏移仅为〜300 meV,比简单预期的要小一个数量级,而且显然也不是一系列的总和。 LaAlO3块中的逐个单元移位的结果。这两个事实都与简单的电荷转移图相矛盾,电荷转移图涉及LaAlO3价带在SrTiO3导带之上的累积移位,从而导致仅n≥4的电荷转移。我们讨论了可能挫败这种优雅而简单的电荷转移模型的影响,并得出结论,尽管不能排除这种影响,但X射线束的光掺杂不太可能是观察到的行为的原因。转向理论数据,我们的密度泛函模拟表明,在LaAlO3表面以25%的水平存在氧空位会反转LaAlO3中内部场的方向。因此,将实验和理论结果结合在一起,对于现实生活中的样品将显示出一致的图像,其中自然不等到n = 4且已经存在n = 2的机理,而不是理想化LaAlO3的内部电场驱动电子转移在SrTiO3衬底中达到近界面态的过程有效地阻止了导致这些系统中物理发生的初始极化灾难。

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